| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
|
Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. |
Atom probe tomography of swift ion irradiated multilayers |
2009 |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
267 |
912-916 |
|
|
|
Grenier, A.; Larde, R.; Cadel, E.; Le Breton, J.M.; Juraszek, J.; Vurpillot, F.; Tiercelin, N.; Pernod, P.; Teillet, J. |
Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mossbauer spectrometry |
2007 |
Journal of Magnetism and Magnetic Materials |
310 |
2215-2216 |
|
|
|
Brenner, S. Sidney |
FIM/Atom Probe Study of Grain Boundaries in Ni3Al |
|
|
|
|
|
|
|
Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T. |
Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint |
2011 |
37th IEEE Photovoltaic Specialists Conference (PVSC 37) |
|
|
|
|
|
Lauhon, Lincoln J.; Adusumilli, Praneet; Ronsheim, Paul; Flaitz, Philip L.; Lawrence, Dan |
Atom-Probe Tomography of Semiconductor Materials and Device Structures |
2009 |
MRS Bulletin |
34 |
738-743 |
|
|
|
Sha, Gang; Ringer, Simon P.; Duan, Zhi Chao; Langdon, Terence G. |
An atom probe characterisation of grain boundaries in an aluminium alloy processed by equal-channel angular pressing |
2009 |
International Journal of Materials Research |
2009 |
1674-1678 |
|
|
|
Clifton, P. H.; Larson, D. J.; Gordon, L. M.; Joester, D.; Inoue, K.; Reinhard, D. A.; Prosa, T. J.; Ulfig, R. M.; Lawrence, D.; Kelly, T. F. |
Advances in Atom Probe Tomography Applications |
2012 |
The 15th European Microscopy Congress |
|
|
|
|
|
Brenner, S. S.; Miller, M. K.; Soffa, W. A. |
An atom probe study of precipitation in iron-chromium alloys at low temperatures |
1982 |
Proceedings of an International Conference on Solid - Solid Phase Transformations: Proceedings of the International Conference on Solid-To-Solid Phase Transformations in Inorganic Materials Ptm9 |
|
|
|
|
|
Warren, P. J.; Cerezo, A.; Smith, W., G D |
Towards 3D lattice reconstruction with the position sensitive atom probe |
1998 |
Proceedings: Microscopy and Microanalysis |
4 |
86-87 |
|
|
|
Hren, John J. |
Field-ion microscopy |
1968 |
|
|
244 |
|
