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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
Sharma, S. P.; Fonash, S. J.; Schrenk, G. L. |
The electron transfer process in field ionisation |
1970 |
Surface Science |
23 |
|
|
|
Son, U. T.; Hren, J. J. |
Measurement of atomic order with the FIM |
1970 |
Surface Science |
23 |
|
|
|
Goodman, S. R.; Brenner, S. S.; Low, J. R. |
An FIM-atom probe study of the precipitation of copper from iron-1 4 at pct copper I Field-ion microscopy |
1973 |
Metallurgical Transactions |
4 |
2363-2369 |
|
|
Goodman, S. R.; Brenner, S. S.; Low, J. R. |
An FIM-atom probe study of the precipitation of copper from iron-1 4 at pct copper II Atom probe analyses |
1973 |
Metallurgical Transactions |
4 |
2371-2378 |
|
|
Audiffren, M.; Traimond, P.; Bardon, J.; Drechsler, M. |
Study of two-dimensional aggregates of W by field-ion microscopy (French) |
1977 |
3rd Coll. Intl. Phys. Chim. Surf Solides, Grenoble |
|
401 |
|
|
Current, M. I.; Wei, C. Y.; Seidman, D. N. |
Direct observation of the primary state of damage of ion-irradiated tungsten: II. Definitions and results |
1983 |
Philosophical Magazine A |
47 |
407-434 |
|
|
Cerezo, A.; Abraham, M.; Clifton, P.; Lane, H.; Larson, D. J.; Petford-Long, A. K.; Thuvander, M.; Warren, P. J.; Smith, W., G D |
Three-dimensional atomic scale analysis of nanostructured materials |
2001 |
Micron |
32 |
731-739 |
|
|
Ivanisenko, Y.; MacLaren, I.; Sauvage, X.; Valiev, R.Z.; Fecht, H.J. |
Phase transformations in pearlitic steels induced by severe plastic deformation |
2006 |
High Pressure Technology Of Nanomaterials |
114 |
133-144 |
|
|
Grennan-Heaven, N.; Cerezo, A.; Godfrey, T.J.; Smith, G.D.W. |
Optimisation of a scanning atom probe with improved mass resolution using post deceleration |
2007 |
Ultramicroscopy |
107 |
705-712 |
|
|
Heck, P. R.; Pellin, M. J.; Davis, A. M.; Martin, I.; Renaud, I.; Benbalagh, R.; Isheim, D.; Seidman, D. N.; Hiller, J.; Stephan, T.; Lewis, R. S.; Savina, M. R.; Maine, A.; Elam, J.; Staermann, F. J.; Zhao, X.; Daulton, T. L.; Amari, S. |
Atom-Probe Tomographic Analyses of Presolar Silicon Carbide Grains and Meteoric Nanodiamonds – First Results on Silicon Carbide |
2010 |
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