List View
 |   | 
Author Title Year Publication Volume (down) Pages
Causey, R.; Hsu, W.; Mills, B.; Ehrenberg, J.; Phillips, V. Tritium Retention And Migration In Beryllium 1990 Journal Of Nuclear Materials 176 654-660
Current, Michael I.; Seidman, David N. Sputtering of tungsten: a direct view of a near surface depleted zone created by a single 30 keV63 Cu+ projectile 1980 Nuclear Instruments and Methods 170 377-381
Kellogg, G. L.; Brenner, S. S. Atomic-level studies of superconducting YBa2Cu3O7-x 1988 Am. Inst. Phys. Conf. Proc. 165
Cerezo, A.; Abraham, M.; Lane, H.; Larson, D. J.; Thuvander, M.; Seto, K.; Warren, P. J.; Smith, W., G D Three-dimensional atomic scale analysis of interfaces 1999 Electron Microsc. Anal. 1999 161 29-34
Müller, E. W.; Rendulic, K. D. Field ion microscopical imaging of biomolecules 1967 Science 156
Kramer, Lawrence S.; Tack, William T.; Fernandes, Micky T. Scandium in Aluminum Alloys 1997 Advanced Materials & Processes 152 23-24
Serena, P. A.; Escapa, L.; Saenz, J. J.; Garcia, N.; Rohrer, H. Coherent electron-emission from point sources 1988 J. Microsc. 152
Hren, J. J.; Kellogg, G. L. Field-ion microscopy and atom-probe mass spectroscopy of sulfur on the (111) plane of nickel 1984 Surface Science 147,
Everett, K. G.; Walck, S. D.; Schmid, G. M.; Hren, J. J. A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum 1984 Surface Science 145,
Miller, M. K.; Burke, M. G.; Brenner, S. S. Measurement of characteristic wavelengths in modulated microstructures by field-ion microscopy 1985 J. Microsc. 139,