| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Deconihout, B.; Renaud, L.; DaCosta, G.; Bouet, M.; Bostel, A.; Blavette, D. |
Implementation of an optical TAP: preliminary results |
1998 |
Ultramicroscopy |
73 |
253-260 |
|
|
|
Warren, P. J.; Cerezo, A.; Smith, W., G D |
Observation of atomic planes in 3DAP analysis |
1998 |
Ultramicroscopy |
73 |
261-266 |
|
|
|
Ren, D. G. |
Atom probe and field ion microscope investigation of the negative creep mechanism in nickel-base superalloy |
1998 |
J. Mat. Proc. Tech. |
73 |
74-77 |
|
|
|
Deconihout, B.; Vurpillot, F.; Bouet, M.; Renaud, L. |
Improved ion detection efficiency of microchannel plate detectors |
2002 |
Review of Scientific Instruments |
73 |
1734-1740 |
|
|
|
Schlesser, R.; McClure, M. T.; Choi, W. B.; Hren, J. J.; Sitar, Z. |
Energy distribution of field emitted electrons from diamond coated molybdenum tips |
1997 |
Applied Physics Letters |
70 |
1596-1598 |
|
|
|
Brenner, S. S. |
Application of field-ion microscopy techniques to metallurgical problems |
1978 |
Surface Science |
70 |
|
|
|
|
Rendulic, K. D. |
The potential above field adsorbed gas atoms |
1978 |
Surface Science |
70 |
|
|
|
|
Cerezo, A.; Godfrey, T. J.; Sijbrandij, S. J.; Smith, G. D. W.; Warren, P. J. |
Performance of an energy-compensated three-dimensional atom probe |
1998 |
Review of Scientific Instruments |
69 |
49-58 |
|
|
|
Liu, J.; Zhirnov, V. V.; Choi, W. B.; Wojak, G. J.; Myers, A. F.; Cuomo, J. J.; Hren, J. J. |
Electron emission from a hydrogenated diamond surface |
1996 |
Applied Physics Letters |
69 |
4038-4040 |
|
|
|
Cerezo, A.; Godfrey, T. J.; Sijbrandij, S. J.; Smith, W., G D; Warren, P. J. |
Performance of an energy-compensated three-dimensional atom probe |
1998 |
Rev. Sci. Inst. |
69 |
49-58 |
|
