| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Brenner, S. S.; Mckinney, J. T. |
The performance of electron multipliers in FIM atom probes |
1972 |
Review of Scientific Instruments |
43 |
|
|
|
|
M. Young, J.D. DeFouw, J. Frenzel, D.C. Dunand |
Cast Replicated NiTiCu Foams with Shape-Memory Properties |
2012 |
Metallurgical and Materials Transactions A |
43 |
2939-44 |
|
|
|
French, R. D.; Bishop, G. H. |
Grain-boundary contrast in field ion microscope images |
1971 |
Journal of Applied Physics |
42 |
|
|
|
|
Son, U. T.; Hren, J. J. |
Field-ion microscopy of ordered Cu-Au alloy |
1971 |
Journal of Applied Physics |
42 |
|
|
|
|
Brent, D. A.; Rouse, D. J.; Sammons, M. C.; Bursey, M. M. |
Field desorption mass spectrometry Quaternary ammonium salts |
1973 |
Tetrahedron Lett |
42 |
|
|
|
|
Rendulic, K. D.; Krautz, E. |
Is the field ion microscope a desorption microscope? |
1975 |
Acta Phys Austriaca |
42 |
|
|
|
|
Warren, P. J.; Todd, I.; Davies, H. A.; Cerezo, A.; Gibbs, J., M R; Kendall, D.; Major, R. V. |
Partitioning behaviour of Al in a nanocrystalline Fe71.5Si13.5B9Nb3Cu1Al2 alloy |
1999 |
Scripta Materialia |
41 |
1223-1227 |
|
|
|
Jenkins, D. A.; Hren, J. J. |
Metal tip for field ion microscope |
1970 |
Review of Scientific Instruments |
41 |
|
|
|
|
Rendulic, K. D.; Müller, E. W. |
Optical transformation of field ion micrographs |
1970 |
Review of Scientific Instruments |
41 |
|
|
|
|
Walck, S. D.; Hren, J. J. |
FIM/IAP/TEM studies of ion implanted nickel emitters |
1985 |
Mater. Res. Soc. Symp. Ser., Adv. Photon Part. Tech. Charact. Defects Solids, |
41, |
|
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