| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Causey, R.; Hsu, W.; Mills, B.; Ehrenberg, J.; Phillips, V. |
Tritium Retention And Migration In Beryllium |
1990 |
Journal Of Nuclear Materials |
176 |
654-660 |
|
|
|
Current, Michael I.; Seidman, David N. |
Sputtering of tungsten: a direct view of a near surface depleted zone created by a single 30 keV63 Cu+ projectile |
1980 |
Nuclear Instruments and Methods |
170 |
377-381 |
|
|
|
Kellogg, G. L.; Brenner, S. S. |
Atomic-level studies of superconducting YBa2Cu3O7-x |
1988 |
Am. Inst. Phys. Conf. Proc. |
165 |
|
|
|
|
Cerezo, A.; Abraham, M.; Lane, H.; Larson, D. J.; Thuvander, M.; Seto, K.; Warren, P. J.; Smith, W., G D |
Three-dimensional atomic scale analysis of interfaces |
1999 |
Electron Microsc. Anal. 1999 |
161 |
29-34 |
|
|
|
Müller, E. W.; Rendulic, K. D. |
Field ion microscopical imaging of biomolecules |
1967 |
Science |
156 |
|
|
|
|
Kramer, Lawrence S.; Tack, William T.; Fernandes, Micky T. |
Scandium in Aluminum Alloys |
1997 |
Advanced Materials & Processes |
152 |
23-24 |
|
|
|
Serena, P. A.; Escapa, L.; Saenz, J. J.; Garcia, N.; Rohrer, H. |
Coherent electron-emission from point sources |
1988 |
J. Microsc. |
152 |
|
|
|
|
Hren, J. J.; Kellogg, G. L. |
Field-ion microscopy and atom-probe mass spectroscopy of sulfur on the (111) plane of nickel |
1984 |
Surface Science |
147, |
|
|
|
|
Everett, K. G.; Walck, S. D.; Schmid, G. M.; Hren, J. J. |
A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum |
1984 |
Surface Science |
145, |
|
|
|
|
Miller, M. K.; Burke, M. G.; Brenner, S. S. |
Measurement of characteristic wavelengths in modulated microstructures by field-ion microscopy |
1985 |
J. Microsc. |
139, |
|
|
