| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Grenier, A.; Larde, R.; Cadel, E.; Vurpillot, F.; Juraszek, J.; Teillet, J.; Tiercelin, N. |
Atomic-scale study of TbCo[sub 2.5]/Fe multilayers by laser-assisted tomographic atom probe |
2007 |
Journal of Applied Physics |
102 |
033912-33914 |
|
|
|
Brenner, S. S.; Kellogg, G. L. |
Atom probe microanalysis of superconducting YBa[sub:2]Cu[sub:3]O[sub:7-x] |
1988 |
Materials Research Society Symposium Proceedings |
99 |
947-950 |
|
|
|
Ranganathan, B. N.; Grenga, H. E. |
Hydrogen-ion image features of tempered martensite |
1973 |
J. Microsc. |
98 |
|
|
|
|
Holzworth, M.R.; Rudawski, N.G.; Pearton, S.J.; Jones, K.S.; Lu, L.; Kang, T.S.; Ren, F.; Johnson, J.W. |
Characterization of the gate oxide of an AlGaN/GaN high electron mobility transistor |
2011 |
Applied Physics Letters |
98 |
122103-3 |
|
|
|
Chen, Yu-chen Karen; Chu, Yong S.; Yi, JaeMock; McNulty, Ian; Shen, Qun; Voorhees, Peter W.; Dunand, David C. |
Morphological and topological analysis of coarsened nanoporous gold by x-ray nanotomography |
2010 |
Applied Physics Letters |
96 |
043122-043122 |
|
|
|
Vaumousse, D.; Cerezo, A.; Warren, P. J. |
A procedure for quantification of precipitate microstructures from three-dimensional atom probe data |
2003 |
Ultramicroscopy |
95 |
215-221 |
|
|
|
Rendulic, K. D.; Leisch, M. |
The gas supply function in field ion microscopy |
1980 |
Surface Science |
95 |
|
|
|
|
Zhirnov, V. V.; Choi, W. B.; Cuomo, J. J.; Hren, J. J. |
Diamond coated Si and Mo field emitters: diamond thickness effect |
1996 |
Applied Surface Science |
94/95 |
123-128 |
|
|
|
Ding, M. Q.; Choi, W. B.; Myers, A. F.; Sharma, A. K.; Narayan, J.; Cuomo, J. J.; Hren, J. J. |
Field emission enhancement from Mo tip emitters coated with N containing amorphous diamond films |
1997 |
Surf. Coat. Technol. |
94/95 |
672-675 |
|
|
|
Rendulic, K. D.; Leisch, M. |
Field desorption of common gases from iridium and tungsten |
1980 |
Surface Science |
93 |
|
|
