| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Ren, D.; Liu, W. |
A new method of surface segregation analysis |
1989 |
Proc. 3rd Beijing Conf. and Exhib. on Instrum. Analysis (1989) |
|
|
|
|
|
Niedermann, P.; Reneer, C.; Kent, A. D.; Fischer, O. |
Investigation of field emitting microstructures by scanning electron and scanning tunnelling microscopy |
1990 |
Vacuum Microelectronics, 1989 |
|
173-176 |
|
|
|
Warren, J. B. |
Control of silicon field emitter shape with isotropically etched oxide masks |
1990 |
Vacuum Microelectronics, 1989 |
|
37-40 |
|
|
|
Brenner, S. S. |
Field ion microscopy |
1989 |
Crystal Properties & Preparation (1989); Advanced Techniques for Microstructural Characterization, R. Krishnan and T.R. Anantharaman, eds., Trans Tech Publications, Zurich, Switzerland (1989) |
|
|
|
|
|
Bottger, A.; Sha, W.; van Genderen, M. J.; Mittemeijer, E. J.; Smith, W., G D |
Structure and composition of nitrogen enrichments formed in iron-nitrogen martensites at room temperature |
1993 |
High Nitrogen Steels 93, V.G. Gavriljuk and V.M. Nadutov, eds., Institute of Metals Physics, Kiev, Ukraine (1993) 255-60 |
|
|
|
|
|
Liu, J.; Son, U. T.; Stepanova, A. N.; Christensen, K. N.; Wojak, G. W.; Givargizov, E. I.; Bachmann, K. J.; Hren, J. J. |
Formation of silicon carbide films on silicon field emitters |
1993 |
Mater. Res. Soc. Symp. Proc. (1993) 311, 21-26 |
|
|
|
|
|
Ren, D. G. |
A study of atomic distribution in the intermetallic compound by AP-FIM |
1993 |
Proc. 1st Meeting of the Pacific Rim International Conf. on Advanced Material Processes, C. Shi, H. Li, S. Hengde and S. Alexander, eds., Miner. Metals and Mater. Society, Warrendale, PA (1992) 367-72 |
|
|
|
|
|
Brenner, S. S. |
Microchemical analysis of intermetallic alloys using the field-ion microscope atom probe |
1991 |
|
|
|
|
|
|
Bowkett, K. M.; Hren, J.; Ralph, B. |
A study of neutron damage with the field ion microscope |
1964 |
Proc. 3rd European Conf. on Electron Microscopy |
|
|
|
|
|
Ralph, B.; Hren, J. J.; Bowkett, K. M. |
The application of field ion microscopy to radiation damage studies |
1964 |
Symp. on Atomic Collision Cascades in Radiation Damage, M. W. Thompson, ed., (1964) 43 |
|
|
|
