NUCAPT Literature Database

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Liu, W.; Ren, D. M. The study of elementary steps of surface chemical process by using pulsed laser atom probe 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Liu, W.; Chen, H. N.; Liu, L. M.; Ren, D. M. Several key assemblies specially designed for the FEM-FIM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Ren, D. M.; Liu, L. M.; Huang, G. M.; Chen, H. N.; Liu, W. The vacuum system of the FEM-FIM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Hu, B. Y.; Liu, W.; Ren, D. M.; Xiao, S. S. An image processing facility specialized for the FEM-FM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Garber, R. I.; Lazarev, B. G.; Lazareva, L. S.; Kulko, V. B.; I.M Mikhailovskii,; Sidorenko, N. N. Study of the superconducting alloy NbTi with the aid of an autoionic microanalyzer (Russian) 1973 Vopr At Nauhi Tekh Ser Fundam & Prihl Sverkhprovodimost 1 details   openurl
Rouse, D. J.; Brent, D. A. Field desorption mass spectrometry of ten medicinal carbamates 1974 Biological Mass Spectrometry 1 details   openurl
Sammons, M. C.; Bursey, M. M.; Brent, D. A. Field desorption mass spectrometry of the B vitamins pyridoxal pyridoxamine their phosphates and thiamine 1974 Biological Mass Spectrometry 1 details   openurl
Larson, David J.;Prosa, Ty J.; Lawrence, Dan;Geiser, Brian P.; Jones, Clive M.; Kelly, Thomas F. Atom Probe Tomography for Microelectronics 2012 Chapter 10 in: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization 1 407-477 details   openurl
Ren, D. G. AP-FIM investigation of the initial stage of oxidation on the surface of alloys 1995 Surf. Rev. Lett. 2 177-181 details   openurl
Rolander, U.; Andren, H. O. Atom-probe analysis applied to TiC-Ni-based cemented carbides 1989 Proc 12th Intl Plansee Seminar Bildstein H and Ortner H M eds Metallwerk Plansee GmbH Reutee/Tirol Austria 2 details   openurl
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