| Author |
Title |
Year  |
Publication |
Volume |
Pages |
| Rendulic, K. D.; Müller, E. W. |
Elastic deformation of field ion microscope tips |
1967 |
Journal of Applied Physics |
38 |
|
| Sanwald, R. C.; Hren, J. J. |
Computer simulation of field ion images |
1967 |
Surface Science |
7 |
|
| Hren, John J. |
Field-ion microscopy |
1968 |
|
|
244 |
| Brenner, S. S. |
Technique for decreasing photographic recording time in field ion microscopy |
1968 |
Review of Scientific Instruments |
39 |
|
| Brenner, S. S.; Mckinney, J. T. |
On the ionisation state of field evaporated atoms as measured in the field ion microscope-atom probe |
1968 |
Applied Physics Letters |
13 |
29-32 |
| Brenner, S. S.; McVeagh, W. J. |
Field ion microscopy study of the formation of oxide particles on tungsten |
1968 |
J Electrochem Soc |
115 |
|
| French, R. D.; Richman, M. H. |
Carburizing tungsten in the field ion microscope |
1968 |
Phil. Mag. |
18 |
|
| French, R. D.; Richman, M. H. |
Transverse sectioning of field ion microscope specimens for transmission electron microscopy |
1968 |
Trans A S M |
61 |
|
| Hren, J. J. |
Interpretation of field ion microscope images of point and line defects |
1968 |
Field Ion Microscopy, J. J. Hren and S. Ranganathan, ed., Plenum Press, New York (1968) 102 |
|
|
| Lefevre, B. G.; Grenga, H.; Ralph, B. |
Field ion images from ordered Ni4Mo |
1968 |
Phil. Mag. |
18 |
|
