|
Author |
Title |
Year  |
Publication |
Volume |
Pages |
Links |
|
Rendulic, K. D. |
Corrosive surface reaction in the field ion microscope |
1968 |
Surface Science |
12 |
|
|
|
Sanwald, R. C.; Hren, J. J. |
Interpretation of defects in field ion images: FCC materials |
1968 |
Surface Science |
9 |
|
|
|
Breyer, J. P.; Leroy, V.; Habraren, L. |
The field ion microscope |
1969 |
C N R M |
21 |
|
|
|
Fonash, S. J.; Schrenck, G. L. |
Fermi surface structure and field ionisation |
1969 |
Physical Review |
180 |
|
|
|
Graham, W. R.; Hutchinson, F.; Nadakavuikaren, J. I.; Reed, D. A.; Schwenterly, S. W. |
Epitaxial deposition of platinum on iridium at low temperatures |
1969 |
Journal of Applied Physics |
40 |
|
|
|
Grenga, H.; Hochman, R. |
Gas-metal interactions field ion and field emission microscopy |
1969 |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
|
391 |
|
|
Hren, J. J. |
Analysis of dislocations and stacking faults by FIM |
1969 |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
|
87 |
|
|
Rendulic, K. |
Corrosion of field ion microscope specimens |
1969 |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
|
413 |
|
|
Brenner, S. S.; Mckinney, J. T. |
FIM atom probe analysis of individual image spots caused by gas adsorption |
1970 |
Surface Science |
20 |
|
|
|
Brenner, S. S.; Mckinney, J. T. |
Construction and performance of an FIM atom probe |
1970 |
Surface Science |
23 |
|
|