| |
Author |
Title |
Year  |
Publication |
Volume |
Pages |
Links |
|
|
Goldenfeld, I. V.; Nazarenko, V. A. |
Current-voltage characteristics and angular distribution of the ions in field ionisation |
1970 |
International Journal of Mass Spectrometry and Ion Physics |
5 |
|
|
|
|
Jenkins, D. A.; Hren, J. J. |
Metal tip for field ion microscope |
1970 |
Review of Scientific Instruments |
41 |
|
|
|
|
Nazarenko, V. A. |
Calculation of the current voltage characteristics of a field ion microscope |
1970 |
International Journal of Mass Spectrometry and Ion Physics |
5 |
|
|
|
|
Rendulic, K. D. |
A comparison between FIM and LEED studies of surface reconstruction |
1970 |
Surface Science |
21 |
|
|
|
|
Rendulic, K. D.; Müller, E. W. |
Optical transformation of field ion micrographs |
1970 |
Review of Scientific Instruments |
41 |
|
|
|
|
Sharma, S. P.; Fonash, S. J.; Schrenk, G. L. |
The electron transfer process in field ionisation |
1970 |
Surface Science |
23 |
|
|
|
|
Sharma, S. P.; Schrenk, G. L. |
Effect of periodic surface potential variation on high field tunneling in field ionisation process |
1970 |
Phys Rev B |
2 |
|
|
|
|
Son, U. T.; Hren, J. J. |
Field ion microscopy of Frank loops in platinum: Computer simulation and experimental observation |
1970 |
Phil. Mag. |
22 |
|
|
|
|
Son, U. T.; Hren, J. J. |
Measurement of atomic order with the FIM |
1970 |
Surface Science |
23 |
|
|
|
|
Brenner, S. S.; Goodman, S. R. |
FIM-atom probe analysis of thin nitride platelets in Fe-3 at per cent Mo |
1971 |
Scripta Met |
5 |
|
|
