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Author |
Title |
Year  |
Publication |
Volume |
Pages |
Links |
|
|
Brenner, S. Sidney |
FIM/Atom Probe Study of Grain Boundaries in Ni3Al |
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|
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|
|
Moreno-Gobbi, A.; Zamir, G.; Eiras, J.A. |
Ultrasonic investigation of the interaction of hydrogen-dislocations in copper crystals |
|
Materials Science and Engineering: A |
In Press, Corrected Proof |
|
|
|
|
Bowkett, K. M.; Hren, J.; Ralph, B. |
A study of neutron damage with the field ion microscope |
1964 |
Proc. 3rd European Conf. on Electron Microscopy |
|
|
|
|
|
Brenner, S. S. |
Thermal rearrangement of field evaporated indium surfaces |
1964 |
Surface Science |
2 |
|
|
|
|
Ralph, B.; Hren, J. J.; Bowkett, K. M. |
The application of field ion microscopy to radiation damage studies |
1964 |
Symp. on Atomic Collision Cascades in Radiation Damage, M. W. Thompson, ed., (1964) 43 |
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|
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|
|
Brenner, S. S. |
Field ion microscope studies of surfaces |
1965 |
Surfaces: Structure Energetics and Kinetics, Ohio (1965) |
|
|
|
|
|
Hren, J. J. |
An analysis of the atomic configuration of an incoherent twin boundary with the FIM |
1965 |
Acta Met |
13 |
|
|
|
|
Ranganathan, S.; Bowkett, K. M.; Hren, J. J.; Ralph, B. |
The interpretation of field ion micrographs: streak contrast |
1965 |
Phil. Mag. |
12 |
|
|
|
|
Rendulic, K. D.; Müller, E. W. |
Twinning of iridium in a field ion microscope |
1966 |
Journal of Applied Physics |
37 |
2593-2595 |
|
|
|
Sanwald, R. C.; Ranganathan, S.; Hren, J. J. |
Computer-simulated ion-emission images of dislocations: Screw dislocation at the center of {420} |
1966 |
Applied Physics Letters |
9 |
|
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