|
Author |
Title |
Year  |
Publication |
Volume |
Pages |
Links |
|
Brenner, S. S.; Goodman, S. R. |
FIM-atom probe studies of clustering and precipitation in iron alloys |
1971 |
Proc. Meeting Electro-chem Soc. Electrochem. Soc., Washington (1971) 257 |
|
|
|
|
French, R. D. |
Field-ion microscope observations of an incoherent twin segment |
1971 |
Met Trans |
2 |
|
|
|
French, R. D.; Bishop, G. H. |
Grain-boundary contrast in field ion microscope images |
1971 |
Journal of Applied Physics |
42 |
|
|
|
Garber, R. I.; Dranova, Z.; Mikhailovsky, I. M.; Sidorenko, N. N.; Stratienko, V. A. |
Field-ion microscope investigation of lattice defects in tungsten bombarded with high-energy electrons |
1971 |
Sov Phys Sol Stat |
13 |
|
|
|
Goldenfeld, I. V.; Nazarenko, V. A. |
Angular distributions of field ion current (Russian) |
1971 |
Ukr Fiz Zh |
16 |
|
|
|
Newman, R. W.; Hren, J. J. |
Secondary defects in quenched and aged platinum |
1971 |
Met Trans |
2 |
|
|
|
Nishikawa, O.; Rendulic, K. D. |
Some FIM observations on cold- welding of metals |
1971 |
Surface Science |
26 |
|
|
|
Rendulic, K. |
Measurements on field adsorption of Ne and He and the field ionization of a He-Ne mixture |
1971 |
Surface Science |
28 |
|
|
|
Son, U. T.; Hren, J. J. |
Field-ion microscopy of ordered Cu-Au alloy |
1971 |
Journal of Applied Physics |
42 |
|
|
|
Stoltz, D. L.; Hren, J. J. |
Structure of surface defects |
1971 |
Physics of Electronic Ceramics, Marcel Dekker, New York, NY (1971) 357 |
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