|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
Blavette, D.; Cadel, E.; Pareige, C.; Deconihout, B.; Caron, P. |
Phase Transformation and Segregation to Lattice Defects in Ni-Base Superalloys |
2007 |
Microscopy and Microanalysis |
13 |
464-483 |
|
|
Miller, M.K.; Russell, K.F.; Thompson, K.; Alvis, R.; Larson, D.J. |
Review of Atom Probe FIB-Based Specimen Preparation Methods |
2007 |
Microscopy and Microanalysis |
13 |
428-436 |
|
|
Bunton, J.H.; Olson, J.D.; Lenz, D.R.; Kelly, T.F. |
Advances in Pulsed-Laser Atom Probe: Instrument and Specimen Design for Optimum Performance |
2007 |
Microscopy and Microanalysis |
13 |
418-427 |
|
|
Marquis, E.A. |
A Reassessment of the Metastable Miscibility Gap in Al-Ag Alloys by Atom Probe Tomography |
2007 |
Microscopy and Microanalysis |
13 |
484-492 |
|
|
Knipling, K.E.; Dunand, D.C.; Seidman, D.N. |
Atom Probe Tomographic Studies of Precipitation in Al-0.1Zr-0.1Ti (at.%) Alloys |
2007 |
Microscopy and Microanalysis |
13 |
503-516 |
|
|
Gorman, B.P.; Norman, A.G.; Yan, Y. |
Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures |
2007 |
Microscopy and Microanalysis |
13 |
493-502 |
|
|
Stephenson, L.T.; Moody, M.P.; Liddicoat, P.V.; Ringer, S.P. |
New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) Data |
2007 |
Microscopy and Microanalysis |
13 |
448-463 |
|
|
Ringer, S.P.; Larson, D.J.; Moody, M.P.; Miller, M.K.; Kelly, T.F. |
Introduction: Special Issue on Atom Probe Tomography |
2007 |
Microscopy and Microanalysis |
13 |
407-407 |
|
|
Geiser, B.P.; Kelly, T.F.; Larson, D.J.; Schneir, J.; Roberts, J.P. |
Spatial Distribution Maps for Atom Probe Tomography |
2007 |
Microscopy and Microanalysis |
13 |
437-447 |
|
|
Cerezo, A.; Clifton, P.H.; Lozano-Perez, S.; Panayi, P.; Sha, G.; Smith, G.D.W. |
Overview: Recent Progress in Three-Dimensional Atom Probe Instruments and Applications |
2007 |
Microscopy and Microanalysis |
13 |
408-417 |
|