| |
Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Blavette, D.; Cadel, E.; Deconihout, B. |
The Role of the Atom Probe in the Study of Nickel-Based Superalloys |
2000 |
Materials Characterization |
44 |
133-157 |
|
|
|
Danoix, F.; Auger, P. |
Atom Probe Studies of the Fe–Cr System and Stainless Steels Aged at Intermediate Temperature: A Review |
2000 |
Materials Characterization |
44 |
177-201 |
|
|
|
Hono, K.; Ping, D. H. |
Atom Probe Studies of Nanocrystallization of Amorphous Alloy |
2000 |
Materials Characterization |
44 |
203-217 |
|
|
|
Kelly, Thomas F.; Larson, David J. |
Local Electrode Atom Probes |
2000 |
Materials Characterization |
44 |
59-85 |
|
|
|
Larson, D. J.; Miller, M. K. |
Atom Probe Field-Ion Microscopy Characterization of Nickel and Titanium Aluminides |
2000 |
Materials Characterization |
44 |
159-176 |
|
|
|
Miller, M. K. |
The Development of Atom Probe Field-Ion Microscopy |
2000 |
Materials Characterization |
44 |
11-27 |
|
|
|
Miller, M. K.; Burke, M. G. |
Atom Probe Field-Ion Microscopy: 30 Years of Atomic-level Analysis |
2000 |
Materials Characterization |
44 |
1 |
|
|
|
Miller, M. K.; Pareige, P.; Burke, M. G. |
Understanding Pressure Vessel Steels: An Atom Probe Perspective |
2000 |
Materials Characterization |
44 |
235-254 |
|
|
|
Nishikawa, Osamu; Ohtani, Yoshikatsu; Maeda, Kiyoshi; Watanabe, Masafumi; Tanaka, Keiji |
Development of the Scanning Atom Probe and Atomic Level Analysis |
2000 |
Materials Characterization |
44 |
29-57 |
|
|
|
Panitz, J. A. |
The Archetypal Atom-Probe |
2000 |
Materials Characterization |
44 |
3-10 |
|
